Please use this identifier to cite or link to this item: http://lib.jncasr.ac.in:8080/jspui/handle/10572/578
Title: Characterization of Nanomaterials by Physical Methods
Authors: Rao, C N R
Biswas, Kanishka
Keywords: electron microscopy
scanning probe microscopies
diffraction
nanocrystals
nanowires
nanotubes
Walled Carbon Nanotubes
Organic-Aqueous Interface
X-Ray-Scattering
Electronic-Properties
Raman Scattering
Growth-Kinetics
Monodisperse Nanocrystals
Magnetic-Properties
Metal Nanocrystals
Cdse Nanocrystals
Issue Date: 2009
Publisher: Annual Reviews
Citation: Annual Review of Analytical Chemistry 2, 435-462 (2009)
Abstract: Much progress in nanoscience and nanotechnology has been made in the past few years thanks to the increased availability of sophisticated physical methods to characterize nanomaterials. These techniques include electron microscopy and scanning probe microscopies, in addition to standard techniques such as X-ray and neutron diffraction, X-ray scattering, and various spectroscopies. Characterization of nanomaterials includes the determination not only of size and shape, but also of the atomic and electronic structures and other important properties. In this article we describe some of the important methods employed for characterization of nanostructures, describing a few case studies for illustrative purposes. These case studies include characterizations of Au, ReO3, and GaN nanocrystals; ZnO, Ni, and Co nanowires; inorganic and carbon nanotubes; and two-dimensional graphene.
Description: Restricted Access
URI: http://hdl.handle.net/10572/578
Other Identifiers: 1936-1327
Appears in Collections:Research Papers (Prof. C.N.R. Rao)

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