Please use this identifier to cite or link to this item: http://lib.jncasr.ac.in:8080/jspui/handle/10572/28
Title: Use of focused ion beams for making tiny sample holes in gaskets for diamond anvil cells
Authors: Orloff, J
Chandrabhas, Narayana
Ruoff, A L
Keywords: Instruments & Instrumentation
Physics, Applied
X-Ray-Diffraction
Pressure; GPA
Issue Date: Jan-2000
Publisher: American Institute of Physics
Citation: Review of Scientific Instruments, 71(1), 216-219(2000)
Abstract: To achieve multimegabar pressures in the diamond anvil cell, small diamond tips, 20 mu m (or less) in diameter and high strength gasket materials are required. To prevent plastic instability it is therefore necessary to drill sample holes with diameters of 10 mu m (or less) in extremely strong and tough materials such as tungsten. The present paper describes a technique for drilling such holes using focused ion beams. The superior roundness and surface finish of these holes is one of the reasons our group was able to reach pressures of 342 GPa on hydrogen, significantly higher than that reached by other researchers. (C) 2000 American Institute of Physics. [S0034-6748(00)05101-7].
Description: This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
URI: http://hdl.handle.net/10572/28
Other Identifiers: 0034-6748
Appears in Collections:Research Articles (Chandrabhas N.)

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