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Title: Structure and Dielectric Properties of Recurrent Intergrowth Structures Formed by the Aurivillius Family of Bismuth Oxides of the Formula Bi2An−1BnO3n+3
Authors: Subbanna, G N
Row, T N G
Rao, C N R
Keywords: Unit cell
X ray diffraction
Bismuth Chromium Titanium Oxides Mixed
Bismuth Iron Titanium Oxides Mixed
Barium Bismuth Titanium Oxides Mixed
Issue Date: Jun-1990
Publisher: Academic Press Inc
Citation: Journal of Solid State Chemistry 86(2), 206-211 (1990)
Abstract: Crystal structures and dielectric properties of three recurrent intergrowth structures Bi9Ti6CrO27, Bi9Ti6FeO27, and BaBi8Ti7O27 formed by the Aurivillius family of bismuth oxides of the formula Bi2An−1BnO3n+3 are reported. The intergrowths exhibit ferroelectricity and accordingly belong to the noncentrosymmetric space group Cmm2. The ferroelectric curie temperatures of the intergrowths are in the 630–1070 K range.
Description: Restricted Access
Other Identifiers: 0022-4596
Appears in Collections:Research Papers (Prof. C.N.R. Rao)

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